Flex One

/ Spectrometers

Microscope Photoluminescence Spectrometer

Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs, etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm, etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composittion and sourrounding atomic arrangement of materials. Therefore, it is widely used in physics, material science, chemistry and molecular biology and other related fields.

Flex One, the latest in microspectrometers is a fully integrated, versatile and cost effective microspectrometer that combines a microscope head directly coupled to a high-performance, triple gratings, imaging spectrometer.

  • The integration of optical layout – all optical elements adjustments is only needed in the initial installation, to ensure the efficiency and easy using
  • Double light path design – easy to switch the horizontal and vertical optical path, for application on all kinds of sample morphology
  • Ultra-wide spectra range – 300-2200 nm
  • Resolution – 0.1 nm
  • Video monitoring light path – for accurate sampling point adjustment
  • Unique correction function of Emission spectra – to make the spectral measurements more accurate and comparable
  • Multiple excitation wavelength (option) – 325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm, etc.
  • Automatic mapping function (option) – 50mm x 50mm measurement range, or customized special specifications
  • Electroluminescence (EL) feature (option) – extended options
  • Ultra low temperature measuring accessories (option) – providing measurements at ultra low temperature Under 10K
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 Flex One
 The spectral range  300-2200nm
 Spectral resolution  0.1nm
 Excitation wavelength options  325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm, etc.
 Detector  Type: Cooled CCD (2000×256)
 Spectral range: 300-1000nm
 The spatial resolution  Inferior to 100um
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EL Spectrum Measurement

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System composition

  • Excitation source part: lasers of various wavelength from UV to near-infrared bands
  • Microscopic optical path part: specific microscopic optical path of optimization design
  • Spectra acquisition part: Imaging calibrated spectral and high sensitive scientific grade CDD or single point detector and data acquisition device
  • Sample holder: XYZ three-dimensional adjustable sample holder (maanual or automatic), ultra low temperature sample table
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