Lasers & Optical Fibers Technologies
Generic selectors
Exact matches only
Search in title
Search in content
Search in posts
Search in pages

Solar Cell QE Measurement System (Omni-Station) / Spectrometer systems

Omni-Station series is a multifunctional experimental platform which is based on Quantum Efficiency (QE) measurement

Solar Cell QE Measurement System (Omni-Station) summary

The system employs a turnkey integrated design, which can carry out the QE, Reflectivity, Mapping testing functions automatically. There are also Modularization Design special accessories to adapt to different solar cell samples.

  • Solar cell materials: Monocrystal silicon, polycrystalline silicon, α-Si, GaAs, GaInP, InP, Ge, CdTe, CIS, CIGS, DSSC, Organic Solar Cell, Polymer Solar Cell
  • Solar cell structures: single junction, multi-junction, HIT, thin film, HPV and so on.

Contact us
for more informations






    Features
    • Consistent with IEC 60904-8 international Standards
    • High Repeatability tests results
    • High automatization measurement
    • Optional double light path intensity monitoring function
    • Fast Mapping function 20pts/s
    • Import parameters quickly
    Applications
    • Crystalline Silicon Solar Cell Measurement
    • α-i Solar Cell Measurement
    • Dye Sensitized Solar Cell Measurement
    • Copper Indium Gallium Selenide Solar Cell Measurement
    Specifications
    ModelDescription
    OS-T150150W Xenon arc lamp for probe source, optical stability ≦0.8%
    Adjust mechanism: It can easy remove chopper (not included) from probe light
    Monochromic light wavelength range : 400-2000nm, with three gratings
    OS-X150150W Tungsten-halogen light source for probe source, optical stability ≦0.8%
    Adjust mechanism: It can easy remove chopper (not included) from probe light
    Monochromic light wavelength range: 400-2000nm, with three gratings
    Accessories
    QE-A375W Tungsten bias light source with shutter control
    QE-A4150W Tungsten bias light source with shutter control
    QE-A5150W Xenon bias light source with shutter control
    QE-B2Calibrated InGaAs detector
    QE-B3Calibrated Si detector
    QE-C1Specular reflective measurement capability, Si detector 300-1100nm
    QE-C2Integration sphere diffuse reflectance measurement capability
    Dual detector 300-1600nm
    QE-D4Manual 3 axes stage for sample holder. XY Traveling 50x50mm traveling
    and 5mm Z Axis
    OS-SDManual adjust dual filter wheel. Each wheel with 6 positions of 25mm
    (Diameter) filter slot
    OS-SDND (with neutral density filter set)Filter 1 OD: 0.1, 0.2,0.4, 0.8, 1 ; Filter 2 OD: 0.1, 0.3, 0.4, 0.8,2
    OS-TVISD4Transmission measurement set for 350-1000nm. Mount on QE-D4 only
    OS-ACSR540 chopper installed in probe light source lamp housing
    SR810 lock-in amplifier
    QE-F430x30mm sample holder for electrode on both side
    QE-F5Vacuum sample clamp & thermoelectric temperature test fixture
    QE-F6-CSample holder for electrode on back side
    QE-C7Standard diffuse reflection plate
    QE-D1XY motorized stage
    QE-D2XYZ manual stage
    QE-IV-ConvertorShort current amplifier
    Basic System Features
    1. Full spectrum sunlight simulation, optional double light sources, high-light intensity, and high-stability

    The system conforms to the IEC 60904 standard and has dual light sources using the Xenon and Tungsten Halogen lamp to cover the whole spectrum. For different wavelength range, choose the right light source to complete QE measurement. The output light intensity from these lamps remain stable over time to ensure a high level of repeatability in the measurement.

    1. Test results of high repeatability

    The stability of the light source, monochromator high wavelength accuracy and repeatability, the design of optical path, sample of clamping, data acquisition ways to ensure the system with high repeatability of the test result.

    1. Software functions

    The Omni-Station utilises a single windows interface in which all device parameters can be set. All control parameters can be saved as method files and reloaded at any time to resolve the measurement conditions.  These method files can also be transferred between instruments to allow experiment replication. Measured and processed data can be saved and exported in text, Excel or other formats for processing user supplied programmes.

    1. Fast Mapping function

    QE Mapping / Reflectivity Mapping: this function is mainly for a cell area of more than 100x100mm. The user could obtain the minority carrier diffusion length and defect distribution information.

    Fast mapping
    1. QE Mapping
    2. Reflectivity Mapping

    This function is mainly for a cell area of more than 100×100 mm. The user could obtain the minority carrier diffusion length and defect distribution information.

    The above three Mapping data sets are obtained from the one cell at 400nm, 650nm and 950nm wavelength by scanning QE (LBIC). For the 650nm and 950nm maps, the QE data shows that the cell uniformity is better than at 400nm.  For the 400nm data, the sample uniformity is obviously bad around the edge.  By using different wavelengths of light the user can prove different incident depths within the silicon cell.  The longer the incident light wavelength the further into the silicon cell the light will penetrate thus allowing depth profiling and examination of the inner depths of cells.

    Upgrade functions
    • High wavelength resolution transmittance spectrum measurement
    • Diffuse reflectivity measurement
    • Fast measurement of QE & linearity @ wavelength
    • Spectral response of detector measurement

    Sample holders : we have developed many different professional sample holders according to different samples & applications:

    1. QE-F4: sample holder for DSSC, CIGS, GaN, GaAs, Crystalline Si Solar Cell, Semiconductor Solar Cell
    2. QE-F6: sample holder for α-Si, organic solar cell
    3. QE-F6-G: sample holder for α-Si, organic solar cell (with nitrogen circulation)
    All products